Abstract

TELLERIAF, Adrián. TREATMENT OF SPHERICAL ABERRATION BY FOCAL SERIES. Revista Boliviana de Física [online]. 2011, vol.19, n.19, pp.34-41. ISSN 1562-3823.

We present an iterative method for the correction of aberrations in an high resolution transmission electron microscope (with point resolution of 1.7 Å). The method is based on the technique of compensated phase correlation for the alignment of the experimental images. This technique helped us for calculating the wave function of electrons in the outgoing plane of the sample before passing through the projection system and be affected by the spherical aberration of the objective lens. We found that the resolution has been increased at least by 1.4 Å. The resolution of silicon dumbbells confirm this result. Additional tests with other materials can be made to determine the achieved resolution.

Keywords : high; resolution transmission electron microscopy; optical aberrations - imaging and optical processing.

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